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Characterization, testing, measurement, and metrology / edited by Chander Prakash, Sunpreet Singh, and J. Paulo Davim. by Prakash, Chander [editor.] | Singh, Sunpreet, 1989- [editor.] | Davim, J. Paulo [editor.]. Edition: First edition.Material type: Text; Format:
available online
; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, 2021Copyright date: ©2021Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available :
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