Semiconductor devices in harsh conditions / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski.
Material type:
TextSeries: Devices, circuits, and systems: Publisher: Boca Raton : CRC Press, [2017]Copyright date: ©2017Description: 1 online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9781315368948; 9781315332901Subject(s): Semiconductors -- Reliability | Extreme environments | Environmental testingAdditional physical formats: Print version: : No titleDDC classification: 621.38152 LOC classification: TK7871.85 | .S449 2017Online resources: Click here to view.
Contents:
section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design.
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section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design.