Scanning transmission electron microscopy : advanced characterization methods for materials science applications / edited by Alina Bruma.
Material type:
TextPublisher: Boca Raton, FL : CRC Press, 2021Copyright date: ©2021Description: 1 online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9780429243011; 0429243014; 9780429516160; 0429516169; 9780429512735; 0429512732; 9780429519598; 0429519591Subject(s): Scanning transmission electron microscopy -- Data processing | TECHNOLOGY / Material ScienceDDC classification: 570.28/25 LOC classification: QH212.S34 | S33 2021Online resources: Taylor & Francis | OCLC metadata license agreement Summary: "This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials. It explains and exemplifies how to use these methods in order to interpret STEM images and extract suitable information in order to reveal material properties at the nanoscale"-- Provided by publisher.
"This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials. It explains and exemplifies how to use these methods in order to interpret STEM images and extract suitable information in order to reveal material properties at the nanoscale"-- Provided by publisher.
OCLC-licensed vendor bibliographic record.